Improving the Yield of Integrated Circuits

Design for Manufacturability and Statistical Design: A Constructive Approach

---

by Adrian Offerman

Book Description: Design for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization.

The segments of the book are devoted, respectively, to

• understanding the causes of variability;
• design of test structures for variability characterization;
• statistically rigorous data analysis;
• techniques of design for manufacturability in lithography and in chemical mechanical polishing;
• statistical simulation, analysis, and optimization techniques for improving parametric yield.

Read full article »

Page viewed 1014 times since Sun 1 Mar 2009, 0:00.